DeepRWCap: Neural-Guided Random-Walk Capacitance Solver for IC Design
Hector R. Rodriguez, Jiechen Huang, Wenjian Yu

TL;DR
DeepRWCap introduces a neural-guided random walk method for capacitance extraction in IC design, significantly improving accuracy and speed over traditional stochastic methods by leveraging advanced neural architectures trained on diverse dielectric configurations.
Contribution
It presents a novel neural network architecture that guides random walk-based capacitance calculations, enhancing efficiency and accuracy in complex semiconductor structures.
Findings
Achieves 1.24% mean relative error on benchmark tests.
Provides 23% average speedup over Microwalk.
Reaches 49% acceleration on complex, long-runtime designs.
Abstract
Monte Carlo random walk methods are widely used in capacitance extraction for their mesh free formulation and inherent parallelism. However, modern semiconductor technologies with densely packed structures present significant challenges in unbiasedly sampling transition domains in walk steps with multiple high contrast dielectric materials. We present DeepRWCap, a machine learning guided random walk solver that predicts the transition quantities required to guide each step of the walk. These include Poisson kernels, gradient kernels, and the signs and magnitudes of weights. DeepRWCap employs a two stage neural architecture that decomposes structured outputs into face wise distributions and spatial kernels on cube faces. It uses 3D convolutional networks to capture volumetric dielectric interactions and 2D depthwise separable convolutions to model localized kernel behavior. The design…
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Taxonomy
TopicsLow-power high-performance VLSI design · VLSI and FPGA Design Techniques · 3D IC and TSV technologies
