HEDN: A Hard-Easy Dual Network with Source Reliability Assessment for Cross-Subject EEG Emotion Recognition
Qiang Wang, Liying Yang, Jiayun Song, Yifan Bai, Jingtao Du

TL;DR
HEDN is a lightweight, reliability-aware framework for cross-subject EEG emotion recognition that dynamically assesses source quality and employs dual networks to improve adaptation and accuracy.
Contribution
The paper introduces a novel Source Reliability Assessment mechanism and a dual-network architecture to enhance multi-source domain adaptation in EEG emotion recognition.
Findings
Achieves state-of-the-art results on multiple EEG datasets.
Effectively distinguishes high- and low-quality sources during training.
Reduces computational complexity compared to existing methods.
Abstract
Cross-subject electroencephalography (EEG) emotion recognition remains a major challenge in brain-computer interfaces (BCIs) due to substantial inter-subject variability. Multi-Source Domain Adaptation (MSDA) offers a potential solution, but existing MSDA frameworks typically assume equal source quality, leading to negative transfer from low-reliability domains and prohibitive computational overhead due to multi-branch model designs. To address these limitations, we propose the Hard-Easy Dual Network (HEDN), a lightweight reliability-aware MSDA framework. HEDN introduces a novel Source Reliability Assessment (SRA) mechanism that dynamically evaluates the structural integrity of each source domain during training. Based on this assessment, sources are routed to two specialized branches: an Easy Network that exploits high-quality sources to construct fine-grained, structure-aware…
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Taxonomy
TopicsEmotion and Mood Recognition · EEG and Brain-Computer Interfaces · Domain Adaptation and Few-Shot Learning
