Single-particle detection of a semiconductor-to-metal transition by scanning dielectric microscopy
Ruben Millan-Solsona, Jos\'e A. Ruiz-Torres, Carlos Moya, Arantxa Fraile Rodr\'iguez, Adriana I. Figueroa, Gabriel Gomila, Am\'ilcar Labarta, Xavier Batlle

TL;DR
This study uses scanning dielectric microscopy to observe a semiconductor-to-metal transition in individual Bi2S3 nanorods decorated with gold nanoparticles, revealing local dielectric enhancements due to interfacial effects.
Contribution
It introduces a novel single-particle dielectric characterization method for hybrid nanostructures, revealing local electronic property changes upon metal decoration.
Findings
Enhanced dielectric response in Bi2S3 nanorods with Au decoration
Evidence of interfacial polarization and electron transfer
Intrinsic modifications within nanorods drive dielectric changes
Abstract
Hybrid nanostructures that combine semiconducting and metallic components offer great potential for photothermal therapy, optoelectronics, and sensing, by integrating tunable optical properties with enhanced light absorption and charge transport. Boosting the integrated performance of these hybrid systems demands techniques capable of probing local variations of the physical properties inaccessible to bulk analysis. Here, we report the single-particle dielectric characterization of hybrid, semiconducting bismuth sulfide (BiS) nanorods (NR) decorated with metallic Au nanoparticles (NP), employing scanning dielectric microscopy, which uses electrostatic force microscopy in combination with finite-element numerical simulations. We reveal a pronounced enhancement in the local dielectric response of BiS upon Au decoration, attributed to interfacial polarization and electron…
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Taxonomy
TopicsChemical and Physical Properties of Materials · Gold and Silver Nanoparticles Synthesis and Applications · Force Microscopy Techniques and Applications
