Adapting General-Purpose Foundation Models for X-ray Ptychography in Low-Data Regimes
Robinson Umeike, Neil Getty, Yin Xiangyu, Yi Jiang

TL;DR
This paper introduces PtychoBench, a benchmark for ptychographic analysis, comparing fine-tuning and in-context learning strategies for adapting foundation models to scientific microscopy tasks in low-data scenarios.
Contribution
The paper presents a new benchmark and systematically evaluates specialization strategies, revealing task-dependent optimal adaptation methods for scientific AI applications.
Findings
Supervised fine-tuning and ICL are complementary for visual artifact detection.
ICL on large models outperforms SFT for textual parameter recommendation.
Context-aware prompting enhances performance across tasks.
Abstract
The automation of workflows in advanced microscopy is a key goal where foundation models like Language Models (LLMs) and Vision-Language Models (VLMs) show great potential. However, adapting these general-purpose models for specialized scientific tasks is critical, and the optimal domain adaptation strategy is often unclear. To address this, we introduce PtychoBench, a new multi-modal, multi-task benchmark for ptychographic analysis. Using this benchmark, we systematically compare two specialization strategies: Supervised Fine-Tuning (SFT) and In-Context Learning (ICL). We evaluate these strategies on a visual artifact detection task with VLMs and a textual parameter recommendation task with LLMs in a data-scarce regime. Our findings reveal that the optimal specialization pathway is task-dependent. For the visual task, SFT and ICL are highly complementary, with a fine-tuned model guided…
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Taxonomy
TopicsDomain Adaptation and Few-Shot Learning · Multimodal Machine Learning Applications · Machine Learning in Materials Science
