Thickness dependent rare earth segregation in magnetron deposited NdCo$_{4.6}$ thin films studied by Xray reflectivity and Hard Xray photoemission
J. D\'iaz, J. Rodr\'iguez-Fern\'andez, and J. Rubio-Zuazo

TL;DR
This study investigates how neodymium segregation at the surface of NdCo thin films influences magnetic anisotropy, revealing a thickness-dependent segregation process that affects the films' magnetic properties.
Contribution
It provides new insights into the thickness-dependent segregation of Nd atoms in NdCo films and its role in magnetic anisotropy, using advanced X-ray techniques.
Findings
Nd segregation increases with film thickness.
A 2-3 nm Nd-rich surface layer forms.
Segregation correlates with magnetic anisotropy changes.
Abstract
Magnetic anisotropy in disordered rare-earth-transition metals (RE-TM) compounds arises from RE atoms occupying asymmetric environments within the TM lattice. However, the underlying mechanism that promotes such environments remains not fully understood. In this study, we investigate amorphous NdCo thin films deposited by magnetron sputtering, where the magnetic anisotropy evolves with thickness from in-plane to out-of-plane orientation above 40 nm. X-ray reflectivity measurements revealed the progressive formation of an additional layer between the 3 nm Si capping layer and the NdCo film with increasing film thickness. To probe the composition and distribution of Co and Nd near the surface, Hard X-ray Photoemission Spectroscopy (HAXPES) was performed on films ranging from 5 nm to 65 nm in thickness using incident photon energies of 7, 10, and 13 keV. These correspond to…
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