Intermediate Resistive State in Wafer-Scale MoS${_2}$ Memristors through Lateral Silver Filament Growth for Artificial Synapse Applications
Yuan Fa, Milan Buttberg, Ke Ran, Rana Walied Ahmad, Dennis Braun, Lukas V\"olkel, Jimin Lee, Sof\'ia Cruces, Bart Macco, B\'arbara Canto, Holger Lerch, Thorsten Wahlbrink, Holger Kalisch, Michael Heuken, Andrei Vescan, Joachim Mayer, Zhenxing Wang, Ilia Valov, Stephan Menzel

TL;DR
This paper reports on wafer-scale MoS2 memristors exhibiting stable intermediate resistive states due to lateral filament growth, demonstrating their potential for neuromorphic computing with high endurance and reproducibility.
Contribution
The study introduces scalable MoS2 memristors with controllable intermediate resistive states and elucidates the filament formation mechanism through experiments and simulations.
Findings
Stable intermediate resistive states with set/reset voltages within ±1 V
Endurance exceeding 2500 cycles
Retention over 10^6 seconds
Abstract
Memristors based on two-dimensional materials (2DMs) have garnered significant attention due to their fast resistive switching (RS) behavior and atomic-level thickness, which enables low power consumption, making them promising candidates for neuromorphic computing. Among these, memristors based on molybdenum disulfide (MoS) have been extensively studied. Their RS has been attributed to the formation and rupture of conductive filaments (CFs). However, the underlying mechanism of filament formation remains underexplored, and the inherently stochastic nature of RS leads to high variability and limited reproducibility. Additionally, the lack of scalable fabrication techniques for 2DM-based memristors restricts their integration into standard semiconductor technology. Here, we demonstrate memristors based on metal-organic chemical vapor-deposited MoS on the wafer-scale. Our…
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