Unsupervised Anomaly Prediction with N-BEATS and Graph Neural Network in Multi-variate Semiconductor Process Time Series
Daniel Sorensen, Bappaditya Dey, Minjin Hwang, Sandip Halder

TL;DR
This paper introduces two novel models, N-BEATS and GNN, for multivariate time series anomaly prediction in semiconductor manufacturing, improving early fault detection and reducing computational costs.
Contribution
It presents a new two-stage anomaly prediction framework and compares univariate and graph-based forecasting models for better accuracy and efficiency.
Findings
GNN outperforms N-BEATS in forecasting accuracy
Both models predict anomalies effectively up to 50 time points
GNN requires fewer parameters and less computation
Abstract
Semiconductor manufacturing is an extremely complex and precision-driven process, characterized by thousands of interdependent parameters collected across diverse tools and process steps. Multi-variate time-series analysis has emerged as a critical field for real-time monitoring and fault detection in such environments. However, anomaly prediction in semiconductor fabrication presents several critical challenges, including high dimensionality of sensor data and severe class imbalance due to the rarity of true faults. Furthermore, the complex interdependencies between variables complicate both anomaly prediction and root-cause-analysis. This paper proposes two novel approaches to advance the field from anomaly detection to anomaly prediction, an essential step toward enabling real-time process correction and proactive fault prevention. The proposed anomaly prediction framework contains…
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Taxonomy
TopicsAnomaly Detection Techniques and Applications · Industrial Vision Systems and Defect Detection · Fault Detection and Control Systems
