Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly-Imbalanced IC Defect Classification
Hao-Chiang Shao, Chun-Hao Chang, Yu-Hsien Lin, Chia-Wen Lin, Shao-Yun Fang, and Yan-Hsiu Liu

TL;DR
This paper introduces a new large, highly imbalanced IC defect dataset with intra-class diversity and inter-class similarity, and proposes ReCAME-Net, a multi-expert classifier with attention and metric learning, to improve defect classification accuracy.
Contribution
The paper presents the IC-Defect-14 dataset and a novel ReCAME-Net model that effectively handles complex intra-class and inter-class variations in highly imbalanced IC defect classification.
Findings
ReCAME-Net outperforms existing models on IC-Defect-14.
The dataset reveals challenges of intra-class diversity and inter-class similarity.
ReCAME-Net maintains competitive performance on public datasets.
Abstract
Despite significant advancements in deep classification techniques and in-lab automatic optical inspection models for long-tailed or highly imbalanced data, applying these approaches to real-world IC defect classification tasks remains challenging. This difficulty stems from two primary factors. First, real-world conditions, such as the high yield-rate requirements in the IC industry, result in data distributions that are far more skewed than those found in general public imbalanced datasets. Consequently, classifiers designed for open imbalanced datasets often fail to perform effectively in real-world scenarios. Second, real-world samples exhibit a mix of class-specific attributes and class-agnostic, domain-related features. This complexity adds significant difficulty to the classification process, particularly for highly imbalanced datasets. To address these challenges, this paper…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis · Machine Learning and Data Classification
