The thermal and kinematic Sunyaev-Zeldovich effect in galaxy clusters and filaments using multifrequency temperature maps of the cosmic microwave background: Abell 399--Abell 401 cluster pair case study

TL;DR

This paper introduces a multifrequency, multi-instrument methodology to simultaneously measure thermal and kinematic Sunyaev-Zeldovich effects in galaxy clusters and filaments, improving accuracy and revealing new physical insights.

Contribution

It develops a joint fitting approach across multiple frequency maps to better characterize SZ effects and astrophysical foregrounds, demonstrated on the Abell 399--Abell 401 system.

Findings

Consistent tSZ measurements with previous studies.

Peculiar velocities with uncertainties below 600 km/s.

Detected filament optical depth with 8.5σ significance.

Abstract

We present a multifrequency and multi-instrument methodology to study the physical properties of galaxy clusters and cosmic filaments using cosmic microwave background observations. Our approach enables simultaneous measurement of both the thermal (tSZ) and kinematic Sunyaev-Zeldovich (kSZ) effects, incorporates relativistic corrections, and models astrophysical foregrounds such as thermal dust emission. We do this by jointly fitting a single physical model across multiple maps from multiple instruments at different frequencies, rather than fitting a model to a single Compton-$y$ map. We demonstrate the success of this method by fitting the Abell 399-Abell 401 galaxy cluster pair and filament system using archival data from the Planck satellite and new, targeted deep data from the Atacama Cosmology Telescope, covering 11 different frequencies over 14 maps from 30 GHz to 545 GHz. Our tSZ results are consistent with previous work using Compton-$y$ maps. We measure the line-of-sight peculiar velocities of the cluster-filament system using the kSZ effect and find statistical uncertainties on individual cluster peculiar velocities of $\lesssim $600 km s$^{-1}$, which are competitive with current state-of-the-art measurements. Additionally, we measure the optical depth of the filament component with a signal-to-noise of 8.5$\sigma$ and reveal hints of its morphology. This modular approach is well-suited for application to future instruments across a wide range of millimeter and sub-millimeter wavebands.