Hydrogenated Aluminum Doped Zinc Oxide as Highly Transparent and Passivating Indium-Free Recombination Junction for TOPCon-Based Bottom Cell
G\"okhan Alt{\i}ner, Jons Bolding, Yi\u{g}it Mert Kaplan, Floor Souren, Hindrik de Vries, Ra\c{s}it Turan, Hisham Nasser

TL;DR
This study demonstrates that hydrogenated aluminum-doped zinc oxide (AZO:H), deposited via spatial atomic layer deposition, is a highly transparent, passivating, and indium-free material suitable for recombination junctions in tandem solar cells, offering a promising alternative to ITO.
Contribution
The paper introduces AZO:H deposited by spatial ALD as a novel, indium-free recombination junction material with excellent optical and passivation properties for TOPCon-based bottom cells.
Findings
AZO:H films exhibit over 90% transparency in 380-1200 nm range.
Stack with AZO:H and AlOx capping achieves up to 734 mV iVoc after annealing.
AlOx layer enhances thermal stability and passivation quality.
Abstract
Tandem solar cells offer a promising alternative to exceed the efficiency limits of single-junction silicon photovoltaics, yet they require high-performance recombination junctions that are transparent, passivating, and electrically efficient. Indium tin oxide (ITO), which is conventionally used as a recombination junction material, faces challenges related to indium scarcity and sputter-induced damage. This work investigates hydrogenated aluminum-doped zinc oxide (AZO:H) deposited by spatial atomic layer deposition (s-ALD) as a viable indiumfree alternative for TOPCon-based bottom cells. The deposited AZO:H films demonstrate excellent transparency, exceeding 90% in the 380-1200 nm wavelength range. When applied to n-TOPCon surfaces with an AlOx capping layer, the stack achieves an outstanding passivation quality, indicated by implied open-circuit voltage (iVoc) values up to 734 mV…
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Taxonomy
TopicsSilicon and Solar Cell Technologies · solar cell performance optimization · Thin-Film Transistor Technologies
