A Computational Study for Screening High-Selectivity Inhibitors in Area-Selective Atomic Layer Deposition on Amorphous Surfaces
Gijin Kim, Purun-hanul Kim, Suk Gyu Hahm, Myongjong Kwon, Byungha Park, Changho Hong, Seungwu Han

TL;DR
This study uses density functional theory to analyze inhibitor reactivity on amorphous surfaces in atomic layer deposition, highlighting the importance of realistic surface modeling for designing selective inhibitors.
Contribution
It introduces a computational screening method that considers site-specific interactions, advancing the rational design of high-selectivity inhibitors for AS-ALD.
Findings
Greater reactivity of inhibitors on amorphous surfaces compared to crystalline surfaces.
Bridge cleavage is the dominant reaction pathway for most sites.
Reactivity of DMATMS with -NH- sites is similar to that with -NH2, producing volatile products.
Abstract
Area-selective atomic layer deposition (AS-ALD) is an emerging technology in semiconductor manufacturing. However, accurately understanding inhibitor reactivity on surfaces remains challenging, particularly when the substrate is amorphous. In this study, we employ density functional theory (DFT) to investigate reaction pathways and quantify the reactivity of (N,N-dimethylamino)trimethylsilane (DMATMS) and ethyltrichlorosilane (ETS) at silanol (-OH), siloxane (-O-), amine (-NH2), and imide (-NH-) sites on both amorphous and crystalline silicon oxide and silicon nitride surfaces. Notably, both molecules exhibit greater reactivity toward terminal sites (-OH and -NH2) on amorphous surfaces compared to crystalline counterparts. For bridge sites, -O- and -NH-, multiple reaction pathways are identified, with bridge-cleavage reactions being the predominant mechanism, except for DMATMS reactions…
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Taxonomy
TopicsSemiconductor materials and devices · Copper Interconnects and Reliability · Silicon and Solar Cell Technologies
