Atomistic Structure of Transient Switching States in Ferroelectric AlScN
Jiawei Huang, Jinyang Li, Xinyue Guo, Tongqi Wen, David J. Srolovitz, Zhen Chen, Zuhuang Chen, and Shi Liu

TL;DR
This study uncovers the microscopic mechanism of polarization switching in ferroelectric AlScN, revealing that observed transitional regions are projection artifacts and that switching occurs via atomic displacements influenced by Sc content.
Contribution
The paper combines advanced microscopy, simulations, and experiments to clarify the switching mechanism in AlScN, challenging previous interpretations of the intermediate phase.
Findings
Projection artifacts cause broad transitional regions in STEM images.
Switching involves collective atomic displacements along columns.
Increasing Sc content lowers domain wall energy and switching field.
Abstract
We resolve the microscopic mechanism of polarization switching in wurtzite ferroelectric AlScN by integrating advanced thin-film fabrication, ferroelectric switching dynamics characterizations, high-resolution scanning transmission electron microscopy (STEM), and large-scale molecular dynamics simulations enabled by a deep neural network-based interatomic potential. Contrary to earlier interpretations proposing a transient nonpolar intermediate phase, we demonstrate that the broad transitional regions previously observed in STEM images are projection artifacts resulting from the intrinsic three-dimensional zigzag morphology of 180 domain walls, which are a characteristic form of inversion domain boundary. This is further confirmed by STEM imaging of strategically prepared, partially switched AlScN thin films. Our simulations reveal that switching proceeds…
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