Revisiting Efficient Semantic Segmentation: Learning Offsets for Better Spatial and Class Feature Alignment

TL;DR

This paper introduces a novel offset learning paradigm for semantic segmentation that improves class and spatial feature alignment, leading to better accuracy on multiple datasets with minimal additional parameters.

Contribution

It proposes a coupled dual-branch offset learning method that enhances existing lightweight segmentation models without architectural changes.

Findings

Consistent performance improvements on four datasets.

Significant mIoU gains with negligible parameter increase.

Applicable to multiple existing models without extra architecture.

Abstract

Semantic segmentation is fundamental to vision systems requiring pixel-level scene understanding, yet deploying it on resource-constrained devices demands efficient architectures. Although existing methods achieve real-time inference through lightweight designs, we reveal their inherent limitation: misalignment between class representations and image features caused by a per-pixel classification paradigm. With experimental analysis, we find that this paradigm results in a highly challenging assumption for efficient scenarios: Image pixel features should not vary for the same category in different images. To address this dilemma, we propose a coupled dual-branch offset learning paradigm that explicitly learns feature and class offsets to dynamically refine both class representations and spatial image features. Based on the proposed paradigm, we construct an efficient semantic segmentation network, OffSeg. Notably, the offset learning paradigm can be adopted to existing methods with no additional architectural changes. Extensive experiments on four datasets, including ADE20K, Cityscapes, COCO-Stuff-164K, and Pascal Context, demonstrate consistent improvements with negligible parameters. For instance, on the ADE20K dataset, our proposed offset learning paradigm improves SegFormer-B0, SegNeXt-T, and Mask2Former-Tiny by 2.7%, 1.9%, and 2.6% mIoU, respectively, with only 0.1-0.2M additional parameters required.