OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite
Shan Shen, Xingyang Li, Zhuohua Liu, Junhao Ma, Yikai Wang, Yiheng Wu, Yuquan Sun, and Wei W. Xing

TL;DR
OpenYield is an open-source benchmark suite that provides high-fidelity SRAM models and tools for yield analysis and optimization, aiming to improve reproducibility and transferability of research in semiconductor memory design.
Contribution
It introduces a comprehensive ecosystem with realistic SRAM circuit models, a standardized evaluation platform, and an optimization tool for transistor sizing, addressing gaps in existing academic research.
Findings
Provides high-fidelity SRAM circuit generator including second-order effects.
Enables reproducible yield analysis and optimization studies.
Facilitates fair comparison of SRAM yield techniques.
Abstract
Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified academic models and the complexities observed in practice. The lack of open, higher-fidelity benchmarks has hindered reproducibility and transferability, as promising academic techniques often fail to carry over to more realistic settings. We present OpenYield, an open-source ecosystem that aims to narrow this gap through three contributions: (i) An SRAM circuit generator that explicitly incorporates second-order effects (interconnect/line parasitics, inter-cell leakage coupling, and peripheral-circuit variations) that are commonly omitted in academic studies. (ii) A standardized evaluation platform with a simple interface and baseline yield-analysis implementations to enable fair comparisons and reproducible…
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