OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite

TL;DR

OpenYield is an open-source benchmark suite that provides high-fidelity SRAM models and tools for yield analysis and optimization, aiming to improve reproducibility and transferability of research in semiconductor memory design.

Contribution

It introduces a comprehensive ecosystem with realistic SRAM circuit models, a standardized evaluation platform, and an optimization tool for transistor sizing, addressing gaps in existing academic research.

Findings

Provides high-fidelity SRAM circuit generator including second-order effects.

Enables reproducible yield analysis and optimization studies.

Facilitates fair comparison of SRAM yield techniques.

Abstract

Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified academic models and the complexities observed in practice. The lack of open, higher-fidelity benchmarks has hindered reproducibility and transferability, as promising academic techniques often fail to carry over to more realistic settings. We present OpenYield, an open-source ecosystem that aims to narrow this gap through three contributions: (i) An SRAM circuit generator that explicitly incorporates second-order effects (interconnect/line parasitics, inter-cell leakage coupling, and peripheral-circuit variations) that are commonly omitted in academic studies. (ii) A standardized evaluation platform with a simple interface and baseline yield-analysis implementations to enable fair comparisons and reproducible research on these higher-fidelity circuits. (iii) An optimization platform for transistor-level sizing under these models, supporting reproducible studies of robustness/efficiency trade-offs. OpenYield aims to foster more reproducible and transferable progress in SRAM-yield research. The framework is publicly available at https://github.com/ShenShan123/OpenYield