Zero-shot Shape Classification of Nanoparticles in SEM Images using Vision Foundation Models
Freida Barnatan, Emunah Goldstein, Einav Kalimian, Orchen Madar, Avi Huri, David Zitoun, Ya'akov Mandelbaum, Moshe Amitay

TL;DR
This paper presents a zero-shot shape classification method for nanoparticles in SEM images using foundation models, eliminating the need for extensive labeled data and training, and demonstrating high accuracy and robustness.
Contribution
The study introduces a novel zero-shot classification pipeline combining SAM and DINOv2 models for nanoparticle shape analysis without extensive fine-tuning.
Findings
Outperforms fine-tuned YOLOv11 and ChatGPT baselines
Robust to small datasets and morphological variations
Effective across diverse nanoparticle datasets
Abstract
Accurate and efficient characterization of nanoparticle morphology in Scanning Electron Microscopy (SEM) images is critical for ensuring product quality in nanomaterial synthesis and accelerating development. However, conventional deep learning methods for shape classification require extensive labeled datasets and computationally demanding training, limiting their accessibility to the typical nanoparticle practitioner in research and industrial settings. In this study, we introduce a zero-shot classification pipeline that leverages two vision foundation models: the Segment Anything Model (SAM) for object segmentation and DINOv2 for feature embedding. By combining these models with a lightweight classifier, we achieve high-precision shape classification across three morphologically diverse nanoparticle datasets - without the need for extensive parameter fine-tuning. Our methodology…
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