The Effect of Pattern Quality on Measurements of Stress Heterogeneity and Geometrically Necessary Dislocation Density by High-Angular Resolution Electron Backscatter Diffraction
Harison S. Wiesman, David Wallis

TL;DR
This study investigates how pattern quality, controlled by frame averaging, influences HR-EBSD measurements of stress heterogeneity and GND density, highlighting the importance of consistent data collection for accurate microstructural analysis.
Contribution
It demonstrates that increasing frame averaging reduces noise in HR-EBSD data, improving detection of substructure and stress distributions, and emphasizes the need for comparable pattern quality in analyses.
Findings
Higher frame averaging decreases noise in stress and GND maps.
Low band contrast pixels benefit most from increased averaging.
Consistent mean band contrast is crucial for reliable comparisons.
Abstract
We examine the effect of pattern quality on the output of high-angular resolution electron backscatter diffraction (HR-EBSD) analyses. Band contrast, as a proxy for pattern quality, was varied by adjusting the number of frames averaged per electron backscatter pattern during data collection. The same region in a deformed sample of the mineral olivine was mapped six times varying the number of frames averaged between 1 and 30 between each map. Each data set was analyzed with HR-EBSD, producing maps of intragranular stress heterogeneity and geometrically necessary dislocation (GND) density. As the number of frames averaged increased, the noise in stress and GND calculations decreased, revealing more substructure in the mapped region. The worst pixels, with low band contrast, are the most improved by increased frame averaging, whereas those with high band contrast are largely unaffected.…
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