X-ray Emission Spectropolarimetry of Strongly Anisotropic Single Crystal Systems using a Rowland Circle Geometry
Jared E. Abramson, Charles A. Cardot, Josh J. Kas, John J. Rehr, Werner Kaminsky, Herwig Michor, Marta Roman, Petra Becker, Gerald T. Seidler

TL;DR
This paper demonstrates how a Rowland circle geometry can be used as a spectropolarimeter to analyze polarized x-ray emission from strongly anisotropic single crystal systems, revealing detailed electronic and orbital information.
Contribution
It introduces a novel application of the Rowland circle geometry for polarized x-ray emission spectropolarimetry of transition metal systems, expanding the analytical capabilities of x-ray spectroscopy.
Findings
Polarized x-ray emission provides insights into valence electron orbitals.
The method can distinguish between core-to-core and valence-to-core emissions.
Polarized spectra can be extracted with high angular resolution.
Abstract
Polarization dependence has historically seen extensive use in x-ray spectroscopy to determine magnetic and local geometric properties, but more broadly as a way to gain extra sensitivity to electronic structure at the level of individual magnetic orbitals. This is often done in the context of x-ray absorption through techniques like x-ray magnetic circular dichroism or x-ray linear dichroism, but it has seen little application to x-ray emission. Here we explore the information contained in the polarized emission of two 3d transition metal systems across both core-to-core (CtC) and valence-to-core emission (VtC) lines. We demonstrate how the Rowland circle geometry can be used as a spectropolarimeter, and apply it to the x-ray emission spectroscopy of spin-1/2 Cu(II) and spin-0 Ni(II) ions in LiVCuO4 and DyNiC2, respectively. From this we explore how the polarized XES interrogates of…
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Taxonomy
TopicsMagnetic properties of thin films · X-ray Spectroscopy and Fluorescence Analysis · Magnetism in coordination complexes
