Fast 4D-STEM-based phase mapping for amorphous and mixed materials
Andreas Werbrouck, Nikhila C. Paranamana, Xiaoqing He, Matthias J. Young

TL;DR
This paper introduces a fast, scalable method combining QB decomposition and NMF to analyze 4D-STEM data, enabling phase mapping of amorphous and mixed materials at the nanoscale.
Contribution
It presents a novel, efficient preprocessing approach using QB decomposition to accelerate NMF analysis of large 4D-STEM datasets for phase mapping.
Findings
Successfully mapped amorphous and crystalline phases in materials
Achieved analysis scaling independent of data size
Demonstrated method on battery interface samples
Abstract
All materials are made from atoms arranged either in repeating (crystalline) or in random (amorphous) structures. Diffraction measurements probe average distances between atoms and/or planes of atoms. A transmission electron microscope in scanning mode (STEM) can collect spatially resolved 2-dimensional diffraction data, effectively creating a 4-dimensional (4D) hyperspectral dataset (4D-STEM). Interpretation strategies for such 4D data are well-developed for crystalline materials, because their diffraction spectra show intense peaks, allowing for effective phase and crystal orientation mapping at the nanoscale. Yet, because of the continuous nature of the diffraction data for amorphous and mixed materials, it is challenging to separate different amorphous contributions. Nonnegative matrix factorization (NMF) allows separation of 4D-STEM data into components with interpretable…
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Taxonomy
TopicsSurface Roughness and Optical Measurements · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
