Evaluation of a Full Field Fluorescence Imager with Synchrotron Radiation
Piotr Maj, Grzegorz W. Deptuch, Dominik S. Gorni, Giovanni Pinaroli, Gabriella A. Carini, David P. Siddons, Ryan Tappero, Soumyajit Mandal, Donald Pinelli, Timothy Kersten, Nicholas St. John, Abdul K. Rumaiz, Anthony Kuczewski

TL;DR
This paper presents a novel 3FI ASIC for high-speed, high-resolution full-field fluorescence X-ray imaging, enabling in situ microanalysis with low power consumption and addressing limitations of traditional X-ray fluorescence microscopy.
Contribution
The paper introduces a 65 nm CMOS ASIC with 32x32 pixels for full-field fluorescence imaging, offering high energy resolution, low power, and event-driven readout for rapid, high-throughput analysis.
Findings
Achieved 308 eV FWHM energy resolution at 8.04 keV
Power consumption of 200 μW per pixel
Enables in situ trace element microanalysis
Abstract
The design and evaluation on the NSLS-II beamline of the 3FI application specific integrated circuit (ASIC) bump-bonded to a simply, planar, two-dimensionally segmented silicon sensor is presented. The ASIC was developed for Full-Field Fluorescence spectral X-ray Imaging (3FI). It is a small-scale prototype that features a square array of 32x32 pixels with a pitch of 100 {\mu}m. The ASIC was implemented in a 65 nm CMOS process. Each pixel incorporates a charge-sensitive amplifier, shaping filter, discriminator, peak detector, and sample-and-hold circuit, allowing detection of events and storing signal amplitudes. The system operates in an event-driven readout mode, outputting analog values for threshold-triggered events, allowing high-speed multi-element X-ray fluorescence imaging. At power consumption of 200 {\mu}W per pixel, consisting almost uniquely of power dissipated in analog…
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Taxonomy
TopicsParticle Detector Development and Performance · Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis
