An indirect correlation of dielectric properties using optical trapping and dielectric resonance in two different frequency regimes

TL;DR

This paper proposes an indirect method to estimate dielectric permittivity across a broad frequency range by correlating optical trapping measurements with dielectric resonance data, reducing the need for multiple costly instruments.

Contribution

It introduces a novel approach to infer dielectric properties over wide frequencies using optical trapping techniques, bridging optical and microwave measurement regimes.

Findings

Demonstrates correlation between optical trapping and dielectric resonance responses.

Provides a cost-effective alternative for dielectric permittivity estimation.

Enables estimation of dielectric properties without extensive frequency-specific equipment.

Abstract

Dielectric permittivity, $\varepsilon_r$, of materials are often limited to a sub-GHz range using normal LCR meters. In the GHz range the $\varepsilon_r$ can be measured using Vector Network Analyzers and measurement jigs (waveguides) which are specific for different frequency regimes. Hence, to measure er for the entire frequency range one needs several components and is an extremely costly experiment. However, for applications such as Dielectric Resonator Antennas one need to know the er and the dielectric loss to estimate the resonant frequency. An indirect method is proposed in this letter to find the er from Transversely Misaligned Dual-Fiber Optical Trapping at the optical frequency range to approximately estimate {\epsilon}r and thereby understand the correlation between these two regimes of frequency responses.