A Spatial-Physics Informed Model for 3D Spiral Sample Scanned by SQUID Microscopy
J. Senthilnath, Jayasanker Jayabalan, Zhuoyi Lin, Aye Phyu Phyu Aung, Chen Hao, Kaixin Xu, Yeow Kheng Lim, F. C. Wellstood

TL;DR
This paper introduces a spatial-physics informed model (SPIM) for 3D spiral samples scanned with SQUID microscopy, enhancing magnetic image quality and alignment for better current density inversion in non-destructive testing.
Contribution
The paper presents a novel SPIM that integrates image enhancement, alignment, and physics-based inversion to improve magnetic field analysis in SQUID microscopy.
Findings
SPIM improves I-channel sharpness by 0.3%.
SPIM reduces Q-channel sharpness by 25%.
Successfully removes 0.30 rotational and skew misalignments.
Abstract
The development of advanced packaging is essential in the semiconductor manufacturing industry. However, non-destructive testing (NDT) of advanced packaging becomes increasingly challenging due to the depth and complexity of the layers involved. In such a scenario, Magnetic field imaging (MFI) enables the imaging of magnetic fields generated by currents. For MFI to be effective in NDT, the magnetic fields must be converted into current density. This conversion has typically relied solely on a Fast Fourier Transform (FFT) for magnetic field inversion; however, the existing approach does not consider eddy current effects or image misalignment in the test setup. In this paper, we present a spatial-physics informed model (SPIM) designed for a 3D spiral sample scanned using Superconducting QUantum Interference Device (SQUID) microscopy. The SPIM encompasses three key components: i) magnetic…
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Taxonomy
TopicsOptical measurement and interference techniques · Surface Roughness and Optical Measurements
