Scaling Relations, Morphological Stability, and Asymptotic Freedom of Plasma-Surface Deposition Dynamics
Joel Saucedo, Uday Lamba, Hasitha Mahabaduge

TL;DR
This paper develops a renormalization group analysis for plasma-surface deposition, revealing asymptotic freedom and providing a predictive, parameter-efficient model for film microstructure evolution.
Contribution
It introduces a non-perturbative RG framework that links microscopic plasma parameters to large-scale film morphology, explaining empirical scaling laws and predicting stability criteria.
Findings
Effective coupling weakens at large scales, validating continuum models.
Mean grain area scales exponentially with inverse coupling, g.
Predicted pressure independence of grain size in collision-dominated plasmas.
Abstract
Connecting plasma processing parameters to the resultant film microstructure remains a fundamental challenge in materials synthesis, one that has largely confined process design to empirical approaches. To bridge this gap, we develop a predictive analysis of coupling by applying a renormalization group (RG) analysis to an effective Hamiltonian for the stochastic dynamics of the plasma-surface interface, derived systematically from microscopic principles. The central result from this formalism is the system's exhibition of asymptotic freedom; the effective dimensionless coupling, , between the plasma and the growing surface is found to weaken systematically at macroscopic length scales, a finding that provides a rigorous justification for the success of continuum-level models in describing large-scale film evolution. The RG framework yields a non-perturbative scaling relation for the…
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Taxonomy
TopicsPlasma Diagnostics and Applications · Copper Interconnects and Reliability · nanoparticles nucleation surface interactions
