Exponential-recovery model for free-running SPADs with capacity-induced dead-time imperfections
Jan Krause, Nino Walenta

TL;DR
This paper introduces a generalized count-rate model for free-running SPADs that accounts for exponential recovery of quantum efficiency, significantly improving accuracy in high photon flux regimes and simplifying detector characterization.
Contribution
The paper presents a novel analytical model incorporating exponential recovery in SPADs, outperforming traditional models and enabling parameter extraction from simple measurements.
Findings
Model predicts detection statistics accurately in saturation regime
Outperforms conventional step-function models by two orders of magnitude
Enables extraction of key detector parameters from a single histogram
Abstract
Current count-rate models for single-photon avalanche diodes (SPADs) typically assume an instantaneous recovery of the quantum efficiency following dead-time, leading to a systematic overestimation of the effective detection efficiency for high photon flux. To overcome this limitation, we introduce a generalized analytical count-rate model for free-running SPADs that models the non-instantaneous, exponential recovery of the quantum efficiency following dead-time. Our model, framed within the theory of non-homogeneous Poisson processes, only requires one additional detector parameter -- the exponential-recovery time constant . The model accurately predicts detection statistics deep into the saturation regime, outperforming the conventional step-function model by two orders of magnitude in terms of the impinging photon rate. For extremely high photon flux, we further…
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Taxonomy
TopicsOptical Network Technologies · Semiconductor Lasers and Optical Devices · Advanced Optical Network Technologies
