Area-based epigraph and hypograph indices for functional outlier detection
Belen Pulido, Alba M. Franco-Pereira, Rosa E. Lillo, Fabian Scheipl

TL;DR
This paper introduces new area-based indices for functional outlier detection that effectively identify both magnitude and shape anomalies, improving robustness over existing methods.
Contribution
The paper proposes ABEI and ABHI indices and a novel EHyOut procedure that recasts outlier detection as a multivariate problem, enhancing detection accuracy.
Findings
EHyOut outperforms benchmark methods in simulations.
Indices are stable across various contamination levels.
Method effectively detects both magnitude and shape outliers.
Abstract
Detecting outliers in Functional Data Analysis is challenging because curves can stray from the majority in many different ways. The Modified Epigraph Index (MEI) and Modified Hypograph Index (MHI) rank functions by the fraction of the domain on which one curve lies above or below another. While effective for spotting shape anomalies, their construction limits their ability to flag magnitude outliers. This paper introduces two new metrics, the Area-Based Epigraph Index (ABEI) and Area-Based Hypograph Index (ABHI) that quantify the area between curves, enabling simultaneous sensitivity to both magnitude and shape deviations. Building on these indices, we present EHyOut, a robust procedure that recasts functional outlier detection as a multivariate problem: for every curve, and for its first and second derivatives, we compute ABEI and ABHI and then apply multivariate outlier-detection…
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