Semi-Supervised Defect Detection via Conditional Diffusion and CLIP-Guided Noise Filtering
Shuai Li, Shihan Chen, Wanru Geng, Zhaohua Xu, Xiaolu Liu, Can Dong, Zhen Tian, Changlin Chen

TL;DR
This paper presents a semi-supervised defect detection framework using conditional diffusion and CLIP-guided noise filtering, achieving high accuracy with less labeled data in industrial inspection tasks.
Contribution
It introduces a novel semi-supervised approach combining conditional diffusion and CLIP-based noise filtering for defect detection, reducing labeling requirements.
Findings
Achieves 78.4% [email protected] with full labeled data
Reaches 75.1% [email protected] with only 40% labeled data
Demonstrates superior data efficiency over traditional supervised methods
Abstract
In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods, reliant on manual inspection or early image processing algorithms, suffer from inefficiencies, high costs, and limited robustness. This paper introduces a semi-supervised defect detection framework based on conditional diffusion (DSYM), leveraging a two-stage collaborative training mechanism and a staged joint optimization strategy. The framework utilizes labeled data for initial training and subsequently incorporates unlabeled data through the generation of pseudo-labels. A conditional diffusion model synthesizes multi-scale pseudo-defect samples, while a CLIP cross-modal feature-based noise filtering mechanism mitigates label contamination. Experimental…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Advanced Neural Network Applications · Infrastructure Maintenance and Monitoring
MethodsDiffusion · Contrastive Language-Image Pre-training
