Adaptive Variation-Resilient Random Number Generator for Embedded Encryption

TL;DR

This paper introduces an adaptive, variation-resilient RNG for embedded encryption that maintains high-quality, unbiased random streams despite device variations, demonstrated through experimental implementation and statistical testing.

Contribution

It presents a novel adaptive digitizer with a dynamic reference voltage to extract unbiased entropy from stochastic physical sources, improving robustness in embedded cryptography.

Findings

Successfully passes all NIST randomness tests

Operates reliably across 5 to 182 Mbps throughput

Demonstrates robustness against device variation effects

Abstract

With a growing interest in securing user data within the internet-of-things (IoT), embedded encryption has become of paramount importance, requiring light-weight high-quality Random Number Generators (RNGs). Emerging stochastic device technologies produce random numbers from stochastic physical processes at high quality, however, their generated random number streams are adversely affected by process and supply voltage variations, which can lead to bias in the generated streams. In this work, we present an adaptive variation-resilient RNG capable of extracting unbiased encryption-grade random number streams from physically driven entropy sources, for embedded cryptography applications. The system's key feature is its adaptive digitizer with an adaptive reference voltage. As a proof of concept, we employ a stochastic magnetic tunnel junction (sMTJ) device as an entropy source. The impact of variations in the sMTJ is mitigated by the adaptive digitizer, which generates an adaptive short-term average reference voltage that dynamically tracks any stochastic signal drift or deviation, leading to unbiased random bit stream generation. The generated bit streams, due to their higher entropy, then only need to undergo simplified post-processing. A prototype of the adaptive RNG system was experimentally implemented using discrete electronic components and an FPGA for entropy source emulation. Statistical randomness tests based on the National Institute of Standards and Technology (NIST) test suite are conducted on bit streams obtained using the simulations as well as the discrete electronic component implementation, demonstrating that the bit streams consistently pass all 16 tests of the NIST SP 800-22 test suite with a 100% pass rate. Leveraging its simplified post-processing, the adaptive RNG shows consistent operation across a wide range of throughputs from 5 to 182 Mbps.