Time- and Polarization-Resolved Extreme Ultraviolet Momentum Microscopy
Sotirios Fragkos, Quentin Courtade, Olena Tkach, J\'er\^ome Gaudin, Dominique Descamps, Guillaume Barrette, St\'ephane Petit, Gerd Sch\"onhense, Yann Mairesse, and Samuel Beaulieu

TL;DR
This paper introduces a novel ultrafast, polarization-tunable XUV momentum microscope capable of time- and angle-resolved photoemission spectroscopy, enabling detailed studies of quantum materials' electronic structures in out-of-equilibrium conditions.
Contribution
The development of an advanced momentum microscope with multimodal dichroism capabilities and high spatial, energy, and temporal resolution for quantum material investigations.
Findings
Achieved 44 meV energy resolution and 144 fs temporal resolution.
Demonstrated dichroism measurements in photoelectron angular distributions.
Enabled comprehensive momentum-resolved studies of quantum materials.
Abstract
We report the development of an instrument combining an ultrafast, high-repetition-rate, polarization-tunable monochromatic extreme ultraviolet (XUV, 21.6 eV) beamline and a next-generation momentum microscope endstation. This setup enables time- and angle-resolved photoemission spectroscopy of quantum materials, offering multimodal photoemission dichroism capabilities. The momentum microscope simultaneously detects the full surface Brillouin zone over an extended binding energy range. It is equipped with advanced electron optics, including a new type of front lens that supports multiple operational modes. Enhanced spatial resolution is achieved by combining the small XUV beam footprint (33 m by 45 m) with the selection of small regions of interest using apertures positioned in the Gaussian plane of the momentum microscope. This instrument achieves an energy resolution of 44…
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Advanced Fluorescence Microscopy Techniques · Photocathodes and Microchannel Plates
