Is the hyperscaling relation violated below the upper critical dimension in some particular cases?
Hung T. Diep, Van-Thanh Ngo

TL;DR
This paper investigates the critical exponents of thin films in the Ising model using high-precision simulations, revealing deviations from expected hyperscaling relations and proposing an effective dimension concept.
Contribution
The study provides new high-precision measurements of critical exponents for thin Ising films and explores their implications for hyperscaling relations and effective dimensionality.
Findings
Critical exponents deviate from 2D values for film thickness > 1
Hyperscaling relation is violated when using 2D dimension for these exponents
Effective dimension slightly larger than 2 is suggested for the system
Abstract
In this review, we show our results with new interpretation on the critical exponents of thin films obtained by high-performance multi-histogram Monte Carlo simulations. The film thickness consists of a few layers up to a dozen of layers in the direction. The free boundary condition is applied in this direction while in the plane periodic boundary conditions are used. Large plane sizes are used for finite-size scaling. The Ising model is studied with nearest-neighbor (NN) interaction. When , namely the two-dimensional (2D) system, we find the critical exponents given by the renormalization group. While, for , the critical exponents calculated with the high-precision multi-histogram technique show that they deviate slightly but systematically from the 2D values. If we use these values of critical exponents in the hyperscaling relation with , then…
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Taxonomy
TopicsTheoretical and Computational Physics · Physics of Superconductivity and Magnetism · Advanced Condensed Matter Physics
