Engineering Quantum Wire States for Atom Scale Circuitry
Max Yuan, Lucian Livadaru, Roshan Achal, Jason Pitters, Furkan Altincicek, Robert Wolkow

TL;DR
This study uses STM/STS and DFT calculations to analyze atomic silicon wires, revealing how geometry influences electronic states, with implications for atom-scale circuitry and quantum device design.
Contribution
It systematically characterizes silicon dangling bond wires at the atomic scale, linking geometry to electronic properties using combined experimental and theoretical methods.
Findings
Wider wires show increased transmission and multiple mid-gap states.
Small geometric variations significantly affect orbital hybridization.
Wider wires are more robust against hydrogen defects.
Abstract
Recent advances in hydrogen lithography on silicon surfaces now enable the fabrication of complex and error-free atom-scale circuitry. The structure of atomic wires, the most basic and common circuit elements, plays a crucial role at this scale, as the exact position of each atom matters. As such, the characterization of atomic wire geometries is critical for identifying the most effective configurations. In this study, we employed low-temperature (4.5 K) scanning tunneling microscopy (STM) and spectroscopy (STS) to systematically fabricate and characterize six planar wire configurations made up of silicon dangling bonds (DBs) on the H-Si(100) surface. Crucially, the characterization was performed at the same location and under identical tip conditions, thereby eliminating artifacts due to the local environment to reveal true electronic differences among the line configurations. By…
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