Efficient Characterization of Coherent and Correlated Low-Degree Noise in Layers of Gates

TL;DR

This paper introduces a quantum process tomography method that efficiently characterizes low-degree polynomial noise in quantum gate layers using minimal measurements, with practical applicability to non-Clifford gate layers.

Contribution

The authors develop a low-degree ansatz-based tomography protocol that reduces measurement effort and extends to layers with non-Clifford gates, improving noise characterization in quantum systems.

Findings

Logarithmic measurement complexity relative to system size.

Effective tomography of layers with polylogarithmic non-Clifford gates.

Numerical simulations confirm the method's feasibility.

Abstract

We present a quantum process-tomography protocol based on a low-degree ansatz for the quantum channel, i.e. when it can be expressed as a fixed-degree polynomial in terms of Pauli operators. We demonstrate how to perform tomography of such channels with a logarithmic amount of effort relative to the size of the system, by employing random state preparation and measurements in the Pauli basis. We extend the applicability of the protocol to channels consisting of a layer of quantum gates with a polylogarithmic number of non-Clifford gates, followed by a low-degree noise channel. Rather than inverting the layer of quantum gates on the hardware-which would introduce additional errors-we instead carry out the inversion in classical postprocessing, while adding to the sample complexity a factor at most polynomial in system size. Numerical simulations support our theoretical findings and demonstrate the feasibility of our method.