Robust Ferroelectricity in Silicon Dioxide upon Intercalation of Ammonia
Yaxin Gao, Menghao Wu, Jun-Ming Liu

TL;DR
This paper demonstrates that intercalating ammonia into silicon dioxide induces robust, reversible ferroelectricity, potentially enabling silicon-compatible ferroelectric devices with novel quantized polarization effects.
Contribution
It introduces a new method to induce ferroelectricity in SiO2 via NH3 intercalation, revealing unconventional polarization mechanisms and quantized ferroelectricity in silicon-based materials.
Findings
NH3 intercalation into SiO2 is exothermic and induces large polarization.
Reversible ferroelectricity can be achieved through N-Si bond reformation.
Unconventional quantized ferroelectricity may occur under strong electric fields.
Abstract
The nanoelectronic applications of current ferroelectrics have been greatly impeded by their incompatibility with silicon. In this paper we propose a way to induce ferroelectricity in silicon dioxide (SiO2), which is still the most widely used dielectric material in silicon-based chips. We show first-principles evidence that the intercalation of NH3 molecules into crystalline SiO2 is exothermic, where NH3 molecules form quasi-bonds with SiO2, giving rise to large and robust polarizations. In general, such polarization can be reversed via the reformation of N-Si bondings, which is multiaxial so vertical ferroelectricity may emerge in their thin-films of any facets. When the applied external electric field is large enough, however, the system may exhibit unconventional quantized ferroelectricity of unprecedented magnitude, where NH3 may migrate for multiple lattice constants like mobile…
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Taxonomy
TopicsSemiconductor materials and devices · Ferroelectric and Piezoelectric Materials · Ferroelectric and Negative Capacitance Devices
