Influence of oxygen-defects on intraband terahertz conductivity of carbon nanotubes
Maksim Paukov, Shuang Sun, Dmitry Krasnikov, Arina Radivon, Gennady Komandin, Andrey Vyshnevyy, Emil Chiglintsev, Stanislav Colar, Kirill Brekhov, Kirill Zaytsev, Sergei Garnov, Nadzeya Valynets, Albert Nasibulin, Aleksey Arsenin, Valentyn Volkov, Alexander Chernov, Yan Zhang

TL;DR
This study investigates how oxygen-induced defects in single-walled carbon nanotubes affect their terahertz conductivity and charge transport, revealing defect-dependent plasmon shifts and potential for THz device engineering.
Contribution
It introduces a modified Drude model considering non-equilibrium carriers and demonstrates defect-controlled tuning of THz properties in SWCNTs.
Findings
Defects cause a shift in plasmon resonance to higher THz frequencies.
Increased defects lead to reduced conductivity and slower charge migration.
Higher THz field strength diminishes conductivity due to intraband absorption bleaching.
Abstract
The exceptional charge transport properties of single-walled carbon nanotubes (SWCNTs) enable numerous ultrafast optoelectronic applications. Modifying SWCNTs by introducing defects significantly impacts the performance of nanotube-based devices, making defect characterization crucial. This research tracked these effects in oxygen plasma-treated SWCNT thin films. Sub-picosecond electric fields of varying strengths and additional photoexcitation were used to assess how defects influence charge carrier transport. Changes in effective conductivity within the terahertz (THz) range were found to be strongly dependent on impurity levels. The plasmon resonance shift to higher THz frequencies aligns with the defect-induced reduction in conductivity and slowed carrier migration within the network. An increase in THz field strength resulted in diminished conductivity due to intraband absorption…
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