Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy

TL;DR

This paper presents a high-performance C++ framework for efficiently simulating damage diffusion in STEM, enabling better understanding of electron beam damage mechanisms at atomic scale.

Contribution

The work introduces a novel, efficient C++ simulation framework that combines advanced visualization and multithreading for damage diffusion in STEM.

Findings

Achieves faster simulation runtimes with maintained accuracy.

Enables detailed visualization of damage diffusion processes.

Facilitates improved understanding of electron beam damage mechanisms.

Abstract

Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent studies suggest that certain types of damage can be modelled as a diffusion process. However, numerical simulation of such diffusion processes has remained computationally intensive. This work introduces a high-performance C++ framework for simulating damage diffusion process in STEM that combines efficient numerical computation, advanced visualisations, and multithreading to achieve efficient runtime while maintaining accuracy.