CMOS+X: Stacking Persistent Embedded Memories based on Oxide Transistors upon GPGPU Platforms
Faaiq Waqar, Ming-Yen Lee, Seongwon Yoon, Seongkwang Lim, Shimeng Yu

TL;DR
This paper proposes integrating oxide transistor-based persistent memory in GPGPU architectures to overcome SRAM scaling limits, resulting in significant improvements in memory capacity, energy efficiency, and overall GPU performance.
Contribution
It introduces CMOS+X oxide-based memory cells as a novel solution for high-bandwidth GPGPU memories, demonstrating their density, energy benefits, and performance gains through detailed analysis and GPU benchmarking.
Findings
3x more read ports with 70% lower standby power
Up to 5.2x performance per watt improvement
8% higher geometric mean IPC
Abstract
In contemporary general-purpose graphics processing units (GPGPUs), the continued increase in raw arithmetic throughput is constrained by the capabilities of the register file (single-cycle) and last-level cache (high bandwidth), which require the delivery of operands at a cadence demanded by wide single-instruction multiple-data (SIMD) lanes. Enhancing the capacity, density, or bandwidth of these memories can unlock substantial performance gains; however, the recent stagnation of SRAM bit-cell scaling leads to inequivalent losses in compute density. To address the challenges posed by SRAM's scaling and leakage power consumption, this paper explores the potential CMOS+X integration of amorphous oxide semiconductor (AOS) transistors in capacitive, persistent memory topologies (e.g., 1T1C eDRAM, 2T0C/3T0C Gain Cell) as alternative cells in multi-ported and high-bandwidth banked GPGPU…
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Taxonomy
TopicsParallel Computing and Optimization Techniques · 3D IC and TSV technologies · Advanced Data Storage Technologies
