Quantitative electron beam-single atom interactions enabled by sub-20-pm precision targeting
Kevin M. Roccapriore, Frances M. Ross, Julian Klein

TL;DR
This paper introduces a sub-20-pm precision electron beam technique called atomic lock-on (ALO) that enables targeted, low-dose interactions with single atoms, allowing repeated measurements and observation of atomic dynamics despite sample drift.
Contribution
The paper presents a novel high-precision electron beam positioning method that allows deterministic targeting and measurement of single atoms in electron microscopy.
Findings
Achieved sub-20-pm electron beam targeting accuracy.
Enabled repeated measurements of atomic signals despite drift.
Observed atomic bistability and recapture phenomena.
Abstract
The ability to probe and control matter at the picometer scale is essential for advancing quantum and energy technologies. Scanning transmission electron microscopy offers powerful capabilities for materials analysis and modification, but sample damage, drift, and scan distortions hinder single atom analysis and deterministic manipulation. Materials analysis and modification via electron-solid interactions could be transformed by precise electron delivery to a specified atomic location, maintaining the beam position despite drift, and minimizing collateral dose. Here we develop a fast, low-dose, sub-20-pm precision electron beam positioning technique, atomic lock-on, (ALO), which offers the ability to position the beam on a specific atomic column without previously irradiating that column. We use this technique to lock onto the same selected atomic location to repeatedly measure its…
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