Ultra-High-Temperature Vacuum Prober for Electrical and Thermal Measurements
Laurent Jalabert, Jose Ordonez-Miranda, Yunhui Wu, Byunggi Kim, Roman Anufriev, Masahiro Nomura, Sebastian Volz

TL;DR
This paper introduces an ultra-high-temperature vacuum probe station capable of precise electrical and thermal measurements of materials up to 1150 K, enabling simultaneous property analysis without contact re-adjustments.
Contribution
The development of a contactless, high-temperature vacuum probe station that measures electrical and thermal properties simultaneously up to 1150 K is a novel advancement.
Findings
Measured electrical signals from 30 nV upward on sapphire.
Determined thermal conductivity and diffusivity of sapphire at high temperatures.
Achieved stable measurements over 66 hours without contact re-adjustment.
Abstract
We develop an ultra-high-temperature vacuum probe station (UHT-VPS) featuring a sample holder heated by thermal radiation from a silicon carbide heater. This contactless configuration electrically isolates the sample from the high-power heating source through a vacuum gap, ensuring reliable measurements under extreme conditions. The capability of this UHT-VPS to measure electrical signals from 30 nV upward on bulk sapphire is demonstrated using the 3w/2w method. Measurements are continuously operated from 300 to 1150 K, under high vacuum, for a total of about 66 hours without readjusting the contact. They yield the linear and quadratic temperature coefficients of resistance of chromium/platinum micro-resistances, as well as the sapphire's thermal conductivity and thermal diffusivity. By recording the heater and sensor temperature signals up to 30 kHz and fitting them with theoretical…
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Taxonomy
TopicsThermal properties of materials · Advanced Sensor Technologies Research · Force Microscopy Techniques and Applications
