Directional Dark Field for Nanoscale Full-Field Transmission X-Ray Microscopy

TL;DR

This paper introduces the first directional dark-field imaging method for nanoscale transmission X-ray microscopy, enabling orientation mapping of nanostructures below the spatial resolution limit.

Contribution

The work presents a simple, experimentally feasible approach to retrieve directional scattering information at the nanoscale, extending dark-field imaging capabilities.

Findings

Successfully resolved sub-resolution structure orientations.

Mapped nanocrystal arrangements in human tooth enamel.

Extended scattering vector range using shadow regions.

Abstract

Dark-field X-ray imaging visualizes structural inhomogeneities through small-angle scattering, but existing directional methods are confined to the micrometer scale. While recent advances have extended dark-field capabilities to nanoscale transmission X-ray microscopy, directional scattering retrieval - critical for characterizing anisotropic nanostructures - has remained inaccessible for imaging resolutions in the sub-micrometer scale. Here, we demonstrate the first directional dark-field setup for nanoimaging, achieving orientation mapping of scattering features below the spatial resolution limit. Our method is experimentally simple to implement with existing transmission X-ray microscopy setups. We validate its performance by successfully resolving sub-resolution test structure orientations, cross-correlating orientational changes within hierarchical nanoporous materials, and mapping the directional arrangement of hydroxyapatite nanocrystals 30 - 70 nm within human tooth enamel. By utilizing shadow regions in the optical configuration, we further extend the detectable scattering vector range, demonstrating a pathway toward size-selective dark-field imaging. This advancement enables the quantitative structural characterization of anisotropic nanomaterials, which are critical to biomineralization, advanced materials, and nanotechnology applications.