From Lab to Factory: Pitfalls and Guidelines for Self-/Unsupervised Defect Detection on Low-Quality Industrial Images
Sebastian H\"onel, Jonas Nordqvist

TL;DR
This paper investigates the challenges of applying unsupervised defect detection methods to low-quality industrial images, highlighting pitfalls, providing guidelines for practitioners, and proposing a framework for more reliable empirical risk estimation in real-world settings.
Contribution
It offers practical guardrails for identifying robustness and invariance issues in models and data, and critiques likelihood-based approaches for industrial defect detection.
Findings
Likelihood-based methods often underperform on low-quality data
Common metrics like AUROC can be misleading in practice
Guidelines help practitioners improve real-world defect detection
Abstract
The detection and localization of quality-related problems in industrially mass-produced products has historically relied on manual inspection, which is costly and error-prone. Machine learning has the potential to replace manual handling. As such, the desire is to facilitate an unsupervised (or self-supervised) approach, as it is often impossible to specify all conceivable defects ahead of time. A plethora of prior works have demonstrated the aptitude of common reconstruction-, embedding-, and synthesis-based methods in laboratory settings. However, in practice, we observe that most methods do not handle low data quality well or exude low robustness in unfavorable, but typical real-world settings. For practitioners it may be very difficult to identify the actual underlying problem when such methods underperform. Worse, often-reported metrics (e.g., AUROC) are rarely suitable in…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Advanced Neural Network Applications · Image and Object Detection Techniques
