Intelligent Assistants for the Semiconductor Failure Analysis with LLM-Based Planning Agents
Aline Dobrovsky, Konstantin Schekotihin, Christian Burmer

TL;DR
This paper presents an LLM-based planning agent that automates and orchestrates complex tasks in semiconductor failure analysis, improving efficiency and reliability in FA workflows.
Contribution
It introduces a novel LLM-based planning agent that integrates AI components for autonomous, cohesive semiconductor failure analysis workflows.
Findings
Demonstrates effective integration of LLMs with planning and external tools.
Shows improved automation and reliability in FA tasks.
Validates the system's operational effectiveness.
Abstract
Failure Analysis (FA) is a highly intricate and knowledge-intensive process. The integration of AI components within the computational infrastructure of FA labs has the potential to automate a variety of tasks, including the detection of non-conformities in images, the retrieval of analogous cases from diverse data sources, and the generation of reports from annotated images. However, as the number of deployed AI models increases, the challenge lies in orchestrating these components into cohesive and efficient workflows that seamlessly integrate with the FA process. This paper investigates the design and implementation of an agentic AI system for semiconductor FA using a Large Language Model (LLM)-based Planning Agent (LPA). The LPA integrates LLMs with advanced planning capabilities and external tool utilization, allowing autonomous processing of complex queries, retrieval of…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Machine Learning in Materials Science · Big Data and Digital Economy
