Extrinsic Dopants as Growth Modifiers in Cu-Cr-O delafossites: A Study of Incorporation Limits and Film Properties
Marco Moreira, Yves Fleming, Patrick Grysan, Christele Vergne, Adrian Marie Philippe, Petru Lunca-Popa

TL;DR
This study investigates how extrinsic dopants affect the structure and properties of Cu-Cr-O delafossite thin films grown by chemical vapor deposition, revealing limited dopant incorporation but notable impacts on strain and optical properties.
Contribution
It provides new insights into dopant incorporation limits and their subtle effects on film structure and optical behavior in Cu-Cr-O delafossites.
Findings
Dopant incorporation is below 5%, with Al and Sc detected above the threshold.
Films are epitaxial on sapphire but polycrystalline on silicon.
Doped films show a slight red-shift in optical absorption edge.
Abstract
Cu-Cr-O delafossite thin films were grown by metal-organic chemical vapor deposition with various extrinsic dopants (Al, Mg, Mn, Sc, Y, and Zn) targeted at 5 at % to investigate how such doping influences their structure and properties. X-ray photoelectron spectroscopy revealed that the actual dopant incorporation is well below the nominal 5 %, with only Al and Sc present above detection. An off-stoichiometric Cu-Cr-O composition is determined, with no secondary phases detected. Transmission electron microscopy indicates that films grown on c-plane sapphire are epitaxial near the substrate interface but relax into a polycrystalline structure beyond 20 nm, while films on silicon are polycrystalline throughout. All films show high p-type conductivity (on the order of 10-10^2 Scm-1) attributable to the excess oxygen, with no significant variation among different dopants. Optical…
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Taxonomy
TopicsCopper-based nanomaterials and applications · ZnO doping and properties · Nanoporous metals and alloys
