Revisiting Fourier-Based Reflection Spectrum Measurement in Coherence Scanning Interferometry
Cheng Chen, Sotero Ordones, Jeremy Coupland, and Rong Su

TL;DR
This paper revisits Fourier-based reflection spectrum measurement in coherence scanning interferometry, establishing a generalized framework and analyzing error impacts, with phase change on reflection identified as the dominant factor affecting accuracy.
Contribution
It introduces a matrix-based mathematical model for CSI reflection spectrum measurement and evaluates various error sources affecting spectrum reconstruction accuracy.
Findings
Phase change on reflection significantly impacts spectrum reconstruction.
The generalized model extends Fourier-based methods beyond low NA systems.
Simulation results quantify effects of NA, spectral inaccuracies, and errors on measurement accuracy.
Abstract
Recent advancements have extended the capabilities of coherence scanning interferometry (CSI) beyond surface topography measurement to reflectivity spectrum imaging. It is commonly accepted that the one-dimensional(1-D) Fourier magnitude of a pixel-wise CSI signal is proportional to the product of the sample's absolute reflection coefficient spectrum and the light source spectrum. However, this assumption holds true only for low numerical aperture (NA) CSI systems. In this work, we establish a generalized mathematical framework that represents the CSI signal a matrix multiplication of the spectrum measurement matrix with the element-wise product of the reflection spectrum and the light source spectrum, assuming spectral independence from the incident angles. Considering the light source spectrum and wavenumber channel summation, we utilize a reflection spectrum measurement matrix and…
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Taxonomy
TopicsOptical Coherence Tomography Applications · Integrated Circuits and Semiconductor Failure Analysis · Laser Material Processing Techniques
