Alternating steepest descent methods for tensor completion with applications to spectromicroscopy
Oliver Townsend, Sergey Dolgov, Silvia Gazzola, Misha Kilmer

TL;DR
This paper introduces two novel tensor completion algorithms based on alternating steepest descent, tailored for low-rank tensor reconstruction in spectromicroscopy, demonstrating improved sampling efficiency on real data.
Contribution
The paper develops two new ASD-based tensor completion algorithms in the $igstar_M$-product framework, specifically designed for spectromicroscopy applications, with enhanced sampling efficiency.
Findings
Achieve similar reconstruction accuracy with fewer samples compared to matrix methods.
Effectively handle third-order tensors in spectromicroscopy data.
Algorithms are parallelizable and applicable to real-world data.
Abstract
In this paper we develop two new Tensor Alternating Steepest Descent algorithms for tensor completion in the low-rank -product format, whereby we aim to reconstruct an entire low-rank tensor from a small number of measurements thereof. Both algorithms are rooted in the Alternating Steepest Descent (ASD) method for matrix completion, first proposed in [J. Tanner and K. Wei, Appl. Comput. Harmon. Anal., 40 (2016), pp. 417-429]. In deriving the new methods we target the X-ray spectromicroscopy undersampling problem, whereby data are collected by scanning a specimen on a rectangular viewpoint with X-ray beams of different energies. The recorded absorptions coefficients of the mixed specimen materials are naturally stored in a third-order tensor, with spatial horizontal and vertical axes, and an energy axis. To speed the X-ray spectromicroscopy measurement process up, only a…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced X-ray and CT Imaging · Model Reduction and Neural Networks
