Exploring Topological Effects in Thin-Film X-Ray Cavities

TL;DR

This paper designs and analyzes thin-film x-ray cavities that implement a topological model, revealing edge states in reflectivity spectra, and advancing topological control in x-ray quantum systems.

Contribution

It introduces a non-Hermitian topological model in thin-film x-ray cavities and demonstrates how to identify topological phases through spectral analysis.

Findings

Topological edge states appear in the reflectivity spectra.

Different topological phases can be realized by tuning cavity geometry.

The work opens pathways for topological quantum control in x-ray regimes.

Abstract

Quantum control of single x-ray photons can be achieved using thin-film nanostructure cavities with embedded layers of resonant nuclei. Here, we design and theoretically investigate tailored cavity structures that implement a non-Hermitian version of the Su-Schrieffer-Heeger one-dimensional topological model. By tuning the geometry of the structure, different topological phases can be realized. We show that the presence of topological edge states can be identified in the reflectivity spectra of the thin-film cavities. Our findings pave the way for exploiting topological phases in x-ray quantum control.