Robust copula estimation for one-shot devices with correlated failure modes
E. Castilla, P.J. Chocano

TL;DR
This paper introduces a divergence-based robust estimation method for copula models to accurately assess dependence between failure modes in one-shot devices, especially under outliers or model misspecification.
Contribution
It proposes a novel divergence-based estimation technique that improves robustness over traditional MLE for copula models in one-shot device failure analysis.
Findings
Simulation studies confirm enhanced robustness of the method.
Application to real-world data demonstrates practical utility.
Abstract
This paper presents a robust method for estimating copula models to evaluate dependence between failure modes in one-shot devices-systems designed for single use and destroyed upon activation. Traditional approaches, such as maximum likelihood estimation (MLE), often produce unreliable results when faced with outliers or model misspecification. To overcome these limitations, we introduce a divergence-based estimation technique that enhances robustness and provides a more reliable characterization of the joint failure-time distribution. Extensive simulation studies confirm the robustness of the proposed method. Additionally, we illustrate its practical utility through the analysis of a real-world dataset.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Battery Technologies Research · Radiation Effects in Electronics · VLSI and Analog Circuit Testing
