Exciton condensation from level repulsion: application to bilayer graphene
Harley D. Scammell, Oleg P. Sushkov

TL;DR
This paper proposes a novel method to induce exciton condensation in bilayer graphene using an in-plane electric field, which enhances exciton binding energy through level repulsion, and suggests experimental signatures for detection.
Contribution
It introduces a new control parameter, the in-plane electric field, to promote exciton condensation and provides a model demonstrating this effect in biased bilayer graphene.
Findings
In-plane electric field induces hybridisation between excitons.
Level repulsion enhances exciton binding energy.
Fourier analysis of current-voltage data can detect condensation.
Abstract
Exciton condensation in semiconductors and semimetals has long been predicted but remains elusive. In a semiconductor, condensation occurs when the exciton binding energy matches the band gap. This binding energy results from a balance between Coulomb attraction, which enhances it, and kinetic energy, which suppresses it. However, reducing kinetic energy typically increases screening, weakening Coulomb attraction. Empirically, in most candidate materials, the binding energy remains below the band gap, with few external parameters capable of altering this balance. Here, we propose an in-plane electric field as a control parameter. This field induces hybridisation between even- and odd-parity excitons, and the resulting level repulsion effectively enhances binding energy. We argue that this mechanism is generic to excitons in semiconductors and illustrate it with a model of biased bilayer…
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Taxonomy
Topics2D Materials and Applications · Graphene research and applications · Strong Light-Matter Interactions
