Broadband and high-precision two-level system loss measurement using superconducting multi-wave resonators

TL;DR

This paper introduces a multi-wave superconducting resonator design that significantly improves the accuracy of TLS loss measurements by reducing fluctuations and enhancing SNR, enabling detailed frequency dependence studies.

Contribution

The authors develop and experimentally validate a multi-wave resonator that extends the resonator length to improve TLS loss measurement precision and frequency analysis in superconducting circuits.

Findings

Five-fold reduction in measurement uncertainty of TLS loss.

No observed frequency dependence of TLS loss between 4-6.5 GHz.

Enhanced measurement SNR at low intra-resonator energies.

Abstract

Two-level systems (TLS) are known to be a dominant source of dissipation and decoherence in superconducting qubits. Superconducting resonators provide a convenient way to study TLS-induced loss due to easier design and fabrication in comparison to devices that include non-linear elements. However, accurately measuring TLS-induced loss in a resonator in the quantum regime is challenging due to low signal-to-noise ratio (SNR) and the temporal fluctuations of the TLS, leading to uncertainties of 30% or more. To address these limitations, we develop a multi-wave resonator device that extends the resonator length from a standard quarter-wave $\lambda/4$ to $N\lambda/4$ where $N = 37$ at 6GHz. This design provides two key advantages: the TLS-induced fluctuations are reduced by a factor of $\sqrt{N}$ due to spatial averaging over an increased number of independent TLS, and the measurement SNR for a given intra-resonator energy density improves by a factor of $\sqrt{N}$. The multi-wave resonator also has fundamental and harmonic resonances that allow one to study the frequency dependence of TLS-induced loss. In this work we fabricate both multi-wave and quarter-wave coplanar waveguide resonators formed from thin-film aluminum on a silicon substrate, and characterize their TLS properties at both 10mK and 200mK. Our results show that the power-dependent TLS-induced loss measured from both types of resonators agree well, with the multi-wave resonators achieving a five-fold reduction in measurement uncertainty due to TLS fluctuations, down to 5%. The $N\lambda/4$ resonator also provides a measure of the fully unsaturated TLS-induced loss due to the improved measurement SNR at low intra-resonator energy densities. Finally, measurements across seven harmonic resonances of the $N\lambda/4$ resonator between 4GHz - 6.5GHz reveals no frequency dependence in the TLS-induced loss over this range.