First-principles characterization of native defects and oxygen impurities in GaAs

TL;DR

This study uses hybrid functional calculations to systematically analyze native defects and oxygen impurities in GaAs, revealing defect properties, their electronic levels, and implications for material performance.

Contribution

It provides a detailed first-principles characterization of defects and oxygen impurities in GaAs, identifying their electronic and optical properties and their roles as traps or recombination centers.

Findings

As$_{Ga}$ defect corresponds to the EL2 center but has negligible nonradiative capture.

O$_{As}$ and O$_{As}$-2As$_{Ga}$ defects are identified as Ga--O--Ga centers with high nonradiative capture.

Multiple oxygen-related defect centers can act as carrier traps or recombination centers.

Abstract

We present a systematic investigation of native point defects and oxygen impurities in GaAs using hybrid functional calculations. Defects are characterized by their structural, electronic, and optical properties. Under thermodynamic equilibrium, dominant native defects are Ga antisites (Ga$_{\rm As}$), As antisites (As$_{\rm Ga}$), and/or Ga vacancies ($V_{\rm Ga}$) in which As$_{\rm Ga}$ and $V_{\rm Ga}$ are charge-compensating defects under As-rich conditions. On the basis of the defect transition levels, the isolated As$_{\rm Ga}$ can be identified with the $EL2$ center reported in experiments. The defect, however, has a negligible nonradiative electron capture cross section and thus cannot be the ``main electron trap'' as commonly believed. We find that GaAs can have multiple O-related defect centers, especially when prepared under As-rich conditions. The quasi-substitutional O impurity (O$_{\rm As}$) and its complex with two As$_{\rm Ga}$ defects (O$_{\rm As}$-2As$_{\rm Ga}$) both have a metastable and paramagnetic middle (neutral) charge state; however, only the latter can be identified with the experimentally observed Ga--O--Ga or ``OX'' center. These two defects have large nonradiative electron capture cross sections and can be effective carrier traps or recombination centers, which has important implications for materials design.