Pressure-Driven Metallicity in {\AA}ngstr\"om-Thickness 2D Bismuth and Layer-Selective Ohmic Contact to MoS2
Shuhua Wang, Shibo Fang, Qiang Li, Yunliang Yue, Zongmeng Yang, Xiaotian Sun, Jing Lu, Chit Siong Lau, L. K. Ang, Lain-Jong Li, and Yee Sin Ang

TL;DR
This paper reveals that pressure-induced structural changes cause metallicity in 2D bismuth and introduces a layer-selective Ohmic contact in MoS2-Bi heterostructures, enabling spatial charge injection and layertronic device potential.
Contribution
It uncovers the pressure-driven transition from semiconducting to metallic phases in 2D bismuth and demonstrates a novel layer-selective Ohmic contact in MoS2-Bi heterostructures.
Findings
Pressure induces buckled-to-flat transition in 2D Bi, changing its electronic phase.
Layer-selective Ohmic contact can be switched via external gate polarity.
Charge can be spatially injected into different MoS2 layers in heterostructures.
Abstract
Recent fabrication of two-dimensional (2D) metallic bismuth (Bi) via van der Waals (vdW) squeezing method opens a new avenue to ultrascaling metallic materials into the {\aa}ngstr\"om-thickness regime [Nature 639, 354 (2025)]. However, freestanding 2D Bi is typically known to exhibit a semiconducting phase [Nature 617, 67 (2023), Phys. Rev. Lett. 131, 236801 (2023)], which contradicts with the experimentally observed metallicity in vdW-squeezed 2D Bi. Here we show that such discrepancy originates from the pressure-induced buckled-to-flat structural transition in 2D Bi, which changes the electronic structure from semiconducting to metallic phases. Based on the experimentally fabricated MoS2-Bi-MoS2 trilayer heterostructure, we demonstrate the concept of layer-selective Ohmic contact in which one MoS2 layer forms Ohmic contact to the sandwiched Bi monolayer while the opposite MoS2 layer…
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Taxonomy
Topics2D Materials and Applications · Molecular Junctions and Nanostructures · Semiconductor materials and interfaces
