Quasioptic, Calibrated, Full 2-port Measurements of Cryogenic Devices under Vacuum in the 220-330 GHz Band
Maxim Masyukov, Aleksi Tamminen, Irina Nefedova, Andrey Generalov, Samu-Ville P\"alli, Roman Grigorev, Pouyan Rezapoor, Rui Silva, Juha Mallat, Juha Ala-Laurinaho, Zachary Taylor

TL;DR
This paper presents a novel quasi-optical test setup for accurate cryogenic S-parameter measurements of devices in the 220-330 GHz range, including calibration and validation methods that account for optical and cryostat effects.
Contribution
It introduces a calibrated measurement system with LRM calibration at 330 GHz for cryogenic devices, enabling precise de-embedding of optical and cryostat influences.
Findings
Achieved 30 dB return loss with an empty holder.
Measured temperature-invariant center frequency of stainless steel FSS at 263 GHz.
Improved superconducting filter return loss by 7 dB at 4.8 K.
Abstract
A quasi-optical (QO) test bench was designed, simulated, and calibrated for characterizing S-parameters of devices in the 220-330 GHz (WR-3.4) frequency range, from room temperature down to 4.8 K. The devices were measured through vacuum windows via focused beam radiation. A de-embedding method employing line-reflect-match (LRM) calibration was established to account for the effects of optical components and vacuum windows. The setup provides all four S-parameters with the reference plane located inside the cryostat, and achieves a return loss of 30 dB with an empty holder. System validation was performed with measurements of cryogenically cooled devices, such as bare silicon wafers and stainless-steel frequency-selective surface (FSS) bandpass filters, and superconducting bandpass FSS fabricated in niobium. A permittivity reduction of Si based on 4-GHz resonance shift was observed…
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Taxonomy
TopicsAdvanced Antenna and Metasurface Technologies · Superconducting and THz Device Technology · Microwave and Dielectric Measurement Techniques
