Improving LLM-Based Fault Localization with External Memory and Project Context
Inseok Yeo, Duksan Ryu, Jongmoon Baik

TL;DR
MemFL enhances LLM-based fault localization by integrating project-specific external memory, significantly improving bug detection accuracy, efficiency, and cost-effectiveness, especially for complex software projects.
Contribution
This paper introduces MemFL, a novel method that incorporates static and dynamic project knowledge into LLMs for more effective fault localization.
Findings
MemFL localized 12.7% more bugs than existing methods on Defects4J.
MemFL reduced debugging time to 17.4 seconds per bug.
MemFL achieved cost savings of 67% per bug.
Abstract
Fault localization, the process of identifying the software components responsible for failures, is essential but often time-consuming. Recent advances in Large Language Models (LLMs) have enabled fault localization without extensive defect datasets or model fine-tuning. However, existing LLM-based methods rely only on general LLM capabilities and lack integration of project-specific knowledge, resulting in limited effectiveness, especially for complex software. We introduce MemFL, a novel approach that enhances LLM-based fault localization by integrating project-specific knowledge via external memory. This memory includes static summaries of the project and dynamic, iterative debugging insights gathered from previous attempts. By leveraging external memory, MemFL simplifies debugging into three streamlined steps, significantly improving efficiency and accuracy. Iterative refinement…
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Taxonomy
TopicsSoftware Engineering Research · Software System Performance and Reliability · Software Testing and Debugging Techniques
